hal-00505001, version 1
Kriging for Eddy-Current Testing Problems
Sandor Bilicz
1, 2Emmanuel Vazquez
3, 4Szabolcs Gyimothy 2Jozsef Pavo 2Marc Lambert
1
IEEE Transactions on Magnetics 46, 8 (2010) 3165--3168
Abstract: Accurate numerical simulation of Eddy-Current Testing (ECT) experiments usually requires large computational efforts. So, a natural idea is to build a cheap approximation of the expensive-to-run simulator. This paper presents an approximation method based on functional kriging. Kriging is widely used in other domains, but is still unused in the ECT community. Its main idea is to build a random process model of the simulator. The extension of kriging to the case of functional output data (which is the typical case in ECT) is a recent development of mathematics. The paper introduces functional kriging and illustrates its performance via numerical examples using an ECT simulator based on a surface integral method. A comparison with other classical data interpolation methods is also carried out.
- 1: Laboratoire des signaux et systèmes (L2S)
- UMR8506 CNRS – SUPELEC – Univ Paris-Sud
- 2: Budapest University of Technology and Economics (BME)
- Budapest University of Technology and Economics
- 3: Supélec Sciences des Systèmes - EA4454 (E3S)
- SUPELEC
- 4: GdR MASCOT-NUM ((Méthodes d'Analyse Stochastique des Codes et Traitements Numériques))
- CNRS : GDR3179
- Domain : Engineering Sciences/Electromagnetism
- hal-00505001, version 1
- http://hal.archives-ouvertes.fr/hal-00505001
- oai:hal.archives-ouvertes.fr:hal-00505001
- From: Marc Lambert
- Submitted on: Thursday, 22 July 2010 11:16:31
- Updated on: Thursday, 22 July 2010 11:16:31






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