hal-00702304, version 1
Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution
Mahdi M. Bagher
1Cyril Soler
a, 1Nicolas Holzschuch
a, 1
Computer Graphics Forum 31, 4 (2012)
Abstract: Material models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook- Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.
- a – INRIA
- 1: MAVERICK (Inria Grenoble Rhône-Alpes / LJK Laboratoire Jean Kuntzmann)
- CNRS : UMR5224 – INRIA – Laboratoire Jean Kuntzmann – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) – Université Pierre-Mendès-France - Grenoble II
- Domain : Computer Science/Computer Graphics and Virtual Reality
- hal-00702304, version 1
- http://hal.inria.fr/hal-00702304
- oai:hal.inria.fr:hal-00702304
- From: Nicolas Holzschuch
- Submitted on: Friday, 1 June 2012 11:01:05
- Updated on: Friday, 7 December 2012 16:02:36













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