Automatic Test Generation for Data-Flow Reactive Systems with time constraints - Inria - Institut national de recherche en sciences et technologies du numérique Accéder directement au contenu
Communication Dans Un Congrès Année : 2010

Automatic Test Generation for Data-Flow Reactive Systems with time constraints

Résumé

In this paper, we handle the problem of conformance testing for data-flow critical systems with time constraints. We present a formal model (Variable Driven Timed Automata) adapted for such systems inspired from timed automata using variables as inputs and outputs, and clocks. In this model, we consider urgency and the possibility to fire several transitions instantaneously. We present a conformance relation for this model and we propose a test generation method using a test purpose approach, based on a region graph transformation of the specification.
Fichier principal
Vignette du fichier
2010-ICTSS-Timed.pdf (374.97 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Loading...

Dates et versions

inria-00530584 , version 1 (18-10-2013)

Identifiants

  • HAL Id : inria-00530584 , version 1

Citer

Omer Landry Nguena Timo, Hervé Marchand, Antoine Rollet. Automatic Test Generation for Data-Flow Reactive Systems with time constraints. 22nd IFIP International Conference on Testing Software and Systems (Short Papers), Nov 2010, Natal, Brazil. pp.25-30. ⟨inria-00530584⟩
143 Consultations
64 Téléchargements

Partager

Gmail Facebook X LinkedIn More