Read-Error-Rate evaluation for RFID system on-line testing

Gilles Fritz; Vincent Beroulle; Nguyen Minh Duc; Oum-El-Kheir Aktouf; Ioannis Parissis

hal-00491923, version 1

Read-Error-Rate evaluation for RFID system on-line testing

Gilles Fritz () ¹, Vincent Beroulle () ¹, Nguyen Minh Duc () ¹, Oum-El-Kheir Aktouf () ¹, Ioannis Parissis () ^1, 2

2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) (2010) 1

Abstract: RFID systems are complex hybrid systems, consisting of analog and digital hardware and software components. RFID technologies are often used into critical domains or into harsh environments. But RFID system is only based on low cost equipments which then do not allow achieving robust communications. All these points make the on-line testing of RFID systems a very complex task. Thus, this article proposes the on-line characterization of a statistical system parameter, the Read-Error-Rate, to perform the on-line detection of faulty RFID components. As an introduction to the on-line testing of RFID systems, a FMEA first describes the effects on these systems of potential defects impacting the communication part. Second, a SystemC model of the RFID system is discussed as a way to evaluate the proposed test solutions. Finally, the way the maximal Read-Error-Rate can be determined using system-level simulation is explained.

1: Laboratoire de Conception et d'Intégration des Systèmes (LCIS)
Institut Polytechnique de Grenoble - Grenoble Institute of Technology – Université Pierre-Mendès-France - Grenoble II
2: Laboratoire d'Informatique de Grenoble (LIG)
Université Joseph Fourier - Grenoble I – Institut Polytechnique de Grenoble - Grenoble Institute of Technology – Université Pierre-Mendès-France - Grenoble II – CNRS : UMR5217

hal-00491923, version 1
http://hal.archives-ouvertes.fr/hal-00491923
oai:hal.archives-ouvertes.fr:hal-00491923
From: Vincent Beroulle <>
Submitted on: Monday, 14 June 2010 16:23:47
Updated on: Monday, 14 June 2010 16:23:47

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