inria-00404807, version 1
BPSK bit error outage over Nakagami-m fading channels in lognormal shadowing environments
IEEE Communications Letters 11, 7 (2007) 565-567
Résumé : In this letter, we address the problem of finding a tractable expression for the bit-error outage (BEO) defined as the probability to observe a given average bit error rate (BER) over a fading channel in a shadowing environment. Our contribution is two-fold: (1) a simple yet tight approximation of the bit error probability (BEP) for binary phase shift keying (BPSK) over a frequency-flat Nakagami-m fading channel is derived, which (2) facilitates the derivation of a tight lower bound of the BEO in presence of lognormal shadowing in closed form. Theoretical results are corroborated by means of simulation results, confirming the tightness of the bounds.
- a – INSA - Institut National des Sciences Appliquées
- 1 :
- France Télécom
- 2 :
- CTTC
- 3 :
- INRIA – Institut National des Sciences Appliquées (INSA) - Lyon
- Domaine : Informatique/Réseaux et télécommunications
- inria-00404807, version 1
- http://hal.inria.fr/inria-00404807
- oai:hal.inria.fr:inria-00404807
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- Soumis le : Vendredi 17 Juillet 2009, 11:11:11
- Dernière modification le : Mardi 16 Février 2010, 19:58:43





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