Electrical Impedance Tomography by Elastic Deformation

Habib Ammari; Eric Bonnetier; Yves Capdeboscq; Mickael Tanter; Mathias Fink

hal-00128366, version 2

Electrical Impedance Tomography by Elastic Deformation

Habib Ammari ¹, Eric Bonnetier ², Yves Capdeboscq () ³, Mickael Tanter ¹, Mathias Fink ¹

SIAM Journal on Applied Mathematics 68, 6 (2008) 1557-1573

Abstract: This paper presents a new algorithm for conductivity imaging. Our idea is to extract more information about the conductivity distribution from data that have been enriched by coupling impedance electrical measurements to localized elastic perturbations. Using asymtotics of the fields in the presence of small volume inclusions, we relate the pointwise values of the energy density to the measured data, through a nonlinear PDE. Our algorithm is based on this PDE and takes full advantage of the enriched data. We give numerical examples that illustrate the performance and the accuracy of our approach.

1: Laboratoire ondes et acoustique (LOA)
CNRS : UMR7587 – Université Paris VII - Paris Diderot – ESPCI ParisTech
2: Laboratoire de Modélisation et Calcul (LMC - IMAG)
CNRS : UMR5523 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG)
3: Laboratoire de Mathématiques de Versailles (LM-Versailles)
CNRS : UMR8100 – Université de Versailles Saint-Quentin-en-Yvelines

hal-00128366, version 2
http://hal.archives-ouvertes.fr/hal-00128366
oai:hal.archives-ouvertes.fr:hal-00128366
From: Yves Capdeboscq <>
Submitted on: Sunday, 4 February 2007 13:27:05
Updated on: Tuesday, 17 June 2008 13:56:06

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DOI: 10.1137/070686408

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