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inria-00099956, version 1

Stochastic Battery Model for Embedded Systems

Venkat Rao a, Gaurav Singhal a, Anshul Kumar a, Nicolas Navet () b, 1

18th International Conference on VLSI Design 2005 (2005)

Abstract: This paper explores the recovery and rate capacity effect for batteries used in embedded systems. It throws new light on the battery recovery behavior, which can help determine optimum discharge profile and hence result in significant improvement in battery lifetime. Finally, it proposes a fast and accurate stochastic model which draws the positives from the earlier models and minimizes the drawbacks. Simulations conducted suggest close correspondence with experimental results and a maximum error of 2.65%.

  • a –  DEPARTMENT OF ELECTRICAL ENGINEERING, INDIAN INSTITUTE OF TECHNOLOGY
  • b –  INRIA
  • 1:  TRIO (INRIA Lorraine - LORIA)
  • INRIA – CNRS : UMR7503 – Université Henri Poincaré - Nancy I – Université Nancy II – Institut National Polytechnique de Lorraine (INPL)
  • Domain : Computer Science/Other
  • Keywords : embedded systems – énergie consumption – scheduling – battery model || systèmes embarqués – consommation en énergie – ordonnancement – modèle de batterie
  • Internal note : A04-R-173 || rao04a
  • Comment : Colloque avec actes et comité de lecture. internationale.
 
  • inria-00099956, version 1
  • http://hal.inria.fr/inria-00099956
  • oai:hal.inria.fr:inria-00099956
  • From: Publications Loria <>
  • Submitted on: Tuesday, 26 September 2006 10:12:53
  • Updated on: Tuesday, 29 May 2007 13:58:30