emse-00449370, version 1
Failure models and throughput rate of transfer lines
International Journal of Production Research 45, 8 (2007) 1835-1859
Résumé : This paper addresses the impact of failure models on the performance of transfer lines composed of N machines separated by N - 1 buffers. The two most used failure models, operation-dependent failures (ODF) and time-dependent failures (TDF), are considered. A machine subject to TDF can fail even it is not working on a part. A machine subject to ODF cannot fail if it is not working on a part. A transfer line considered in this paper contains both machines subject to TDF and machines subject to ODF. Up times, repair times and processing times are continuous random variables of general distribution. We prove that modelling a machine subject to ODF of a transfer line as a machine subject to TDF, as usually done in the literature, leads to under-estimation of the throughput rate if the time between failures of the related machine is exponentially distributed while all other times are general random variables. We then propose a timed Petri net approach for performance evaluation and simulation of transfer lines with both machines subject to TDF and machines subject to ODF. Numerical results show that this result holds under more general conditions.
- 1 :
- INRIA – CNRS : UMR7503 – Université Henri Poincaré - Nancy I – Université Nancy II – Ecole normale supérieure de Paris - ENS Paris – Institut National Polytechnique de Lorraine (INPL)
- 2 :
- Université Paul Verlaine - Metz – Ecole Nationale d'Ingénieurs de Metz
- 3 :
- École Nationale Supérieure des Mines - Saint-Étienne
- 4 :
- École Nationale Supérieure des Mines - Saint-Étienne – CIS
- 5 :
- École Nationale Supérieure des Mines - Saint-Étienne – IFR143
- Collaboration : INRIA de Metz
- Domaine : Sciences de l'ingénieur/Génie des procédés
Sciences du Vivant/Ingénierie biomédicale - Mots-clés : Transfer lines – throughput rate – operation-dependent failures – time-dependent failures – timed Petri net
- emse-00449370, version 1
- http://hal-emse.ccsd.cnrs.fr/emse-00449370
- oai:hal-emse.ccsd.cnrs.fr:emse-00449370
- Contributeur :
- Soumis le : Jeudi 21 Janvier 2010, 14:19:30
- Dernière modification le : Jeudi 19 Août 2010, 18:23:52


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