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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5–7, 2015 Revised Selected Papers

Abstract : Book Front Matter of AICT 483
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Submitted on : Tuesday, August 29, 2017 - 3:26:32 PM
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Youngsoo Shin, Chi-Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis. VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5–7, 2015 Revised Selected Papers. Springer, AICT-483, 2016, IFIP Advances in Information and Communication Technology. ⟨hal-01578652⟩

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