CHARACTERIZATION OF SMALL AMR SENSORS IN LIQUID HELIUM TO MEASURE RESIDUAL MAGNETIC FIELD ON SUPERCONDUCTING SAMPLES
Résumé
Trapped residual magnetic flux is responsible of residual surface resistance degradation on superconducting materials used in SRF technologies. To characterize this effect on superconducting samples, compact sensors are required to mount on sample characterization devices. In this paper, we present results on AMR sensors supplied from different manufacturers in the temperature range from 4.2 K up to 300 K.
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