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CHARACTERIZATION OF SMALL AMR SENSORS IN LIQUID HELIUM TO MEASURE RESIDUAL MAGNETIC FIELD ON SUPERCONDUCTING SAMPLES

Abstract : Trapped residual magnetic flux is responsible of residual surface resistance degradation on superconducting materials used in SRF technologies. To characterize this effect on superconducting samples, compact sensors are required to mount on sample characterization devices. In this paper, we present results on AMR sensors supplied from different manufacturers in the temperature range from 4.2 K up to 300 K.
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https://hal.archives-ouvertes.fr/hal-02414152
Contributor : Guillaume Martinet <>
Submitted on : Monday, December 16, 2019 - 2:57:09 PM
Last modification on : Saturday, December 21, 2019 - 1:21:41 AM
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G. Martinet. CHARACTERIZATION OF SMALL AMR SENSORS IN LIQUID HELIUM TO MEASURE RESIDUAL MAGNETIC FIELD ON SUPERCONDUCTING SAMPLES. 19th International Conference on RF Superconductivity, Jun 2019, Dresden, Germany. pp.578, ⟨10.18429/JACoW-SRF2019-TUP058⟩. ⟨hal-02414152⟩

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