Optimized algorithm to reduce the near-field measurement time on FPGA device
Résumé
This paper presents a sequential adaptive sampling algorithm in order to reduce the measurement time of near-field scan. The originality of this approach is to use a deterministic mesh swept according to a sequential progressive adaptive algorithm that defines whether a point must be captured or not. All the proposed algorithm parameters are set according to spatial field characteristics and the measurement setup. This approach is validated on the measurement of the magnetic field produced in near-field region by a FPGA device.
Domaines
Electronique
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Optimize algorithm to reduce the near field measurement time on FPGA_final.pdf (522.14 Ko)
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