Diagnosability study of technological systems

Michel Batteux 1, 2, 3 Philippe Dague 1, 2 Nicolas Rapin 4 Philippe Fiani 3
2 LEO - Distributed and heterogeneous data and knowledge
UP11 - Université Paris-Sud - Paris 11, Inria Saclay - Ile de France, CNRS - Centre National de la Recherche Scientifique : UMR8623
4 LISE
LIST - Laboratoire d'Intégration des Systèmes et des Technologies
Abstract : This paper describes an approach to study the diagnosability of technological systems, by characterizing their observable behaviors. Due to the interaction between many components, faults can occur in a technological system and cause hard damages not only to its integrity but also to its environment. Though a diagnosis system is a suitable solution to detect and identify faults, it is first important to ensure the diagnosability of the system: will the diagnosis system always be able to detect and identify any fault, without any ambiguity, when it occurs? In this paper, we present an approach to identify and integrate faults in a model of a technological system. Then we use these models for the diagnosability study of faults by characterizing their observable behaviors.
Type de document :
Communication dans un congrès
24th International Conference on Industrial, Engineering and other Applications of Applied Intelligent Systems IEA/AIE 2011, Jun 2011, Syracuse, United States. 6703, 2011, LNAI
Liste complète des métadonnées

Littérature citée [10 références]  Voir  Masquer  Télécharger

https://hal.inria.fr/hal-00643664
Contributeur : Philippe Dague <>
Soumis le : mardi 22 novembre 2011 - 15:18:29
Dernière modification le : lundi 24 septembre 2018 - 11:34:03
Document(s) archivé(s) le : jeudi 23 février 2012 - 02:27:05

Fichier

Batteux-IEA-AIE-2011.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

  • HAL Id : hal-00643664, version 1

Collections

Citation

Michel Batteux, Philippe Dague, Nicolas Rapin, Philippe Fiani. Diagnosability study of technological systems. 24th International Conference on Industrial, Engineering and other Applications of Applied Intelligent Systems IEA/AIE 2011, Jun 2011, Syracuse, United States. 6703, 2011, LNAI. 〈hal-00643664〉

Partager

Métriques

Consultations de la notice

464

Téléchargements de fichiers

109