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Diagnosability study of technological systems

Michel Batteux 1, 2, 3 Philippe Dague 1, 2 Nicolas Rapin 4 Philippe Fiani 3 
2 LEO - Distributed and heterogeneous data and knowledge
UP11 - Université Paris-Sud - Paris 11, Inria Saclay - Ile de France, CNRS - Centre National de la Recherche Scientifique : UMR8623
4 LISE - Laboratoire d'Ingénierie dirigée par les modèles pour les Systèmes Embarqués
DILS - Département Ingénierie Logiciels et Systèmes : DRT/LIST/DILS
Abstract : This paper describes an approach to study the diagnosability of technological systems, by characterizing their observable behaviors. Due to the interaction between many components, faults can occur in a technological system and cause hard damages not only to its integrity but also to its environment. Though a diagnosis system is a suitable solution to detect and identify faults, it is first important to ensure the diagnosability of the system: will the diagnosis system always be able to detect and identify any fault, without any ambiguity, when it occurs? In this paper, we present an approach to identify and integrate faults in a model of a technological system. Then we use these models for the diagnosability study of faults by characterizing their observable behaviors.
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https://hal.inria.fr/hal-00643664
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Submitted on : Tuesday, November 22, 2011 - 3:18:29 PM
Last modification on : Saturday, June 25, 2022 - 9:08:33 PM
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Michel Batteux, Philippe Dague, Nicolas Rapin, Philippe Fiani. Diagnosability study of technological systems. 24th International Conference on Industrial, Engineering and other Applications of Applied Intelligent Systems IEA/AIE 2011, Jun 2011, Syracuse, United States. ⟨hal-00643664⟩

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