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PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models

Aymeric Hervieu 1 Benoit Baudry 1 Arnaud Gotlieb 2 
1 TRISKELL - Reliable and efficient component based software engineering
IRISA - Institut de Recherche en Informatique et Systèmes Aléatoires, Inria Rennes – Bretagne Atlantique
2 CELTIQUE - Software certification with semantic analysis
Inria Rennes – Bretagne Atlantique , IRISA-D4 - LANGAGE ET GÉNIE LOGICIEL
Abstract : Feature models are commonly used to specify variability in software product lines. Several tools support feature models for variability management at different steps in the development process. However, tool support for test configuration generation is currently limited. This test generation task consists in systematically selecting a set of configurations that represent a relevant sample of the variability space and that can be used to test the product line. In this paper we propose PACOGEN to analyze feature models and automatically generate a set of configurations that cover all pairwise interactions between features. PACOGEN relies on constraint programming to generate configurations that satisfy all constraints imposed by the feature model and to minimize the set of the tests configurations. This work also proposes an extensive experiment, based on the state-of-the art SPLOT feature models repository, showing that PACOGEN scales over variability spaces with millions of configurations and covers pairwise with less configurations than other available tools.
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Submitted on : Monday, May 21, 2012 - 11:24:52 AM
Last modification on : Thursday, January 20, 2022 - 5:33:23 PM
Long-term archiving on: : Wednesday, August 22, 2012 - 2:25:25 AM


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  • HAL Id : hal-00699558, version 1


Aymeric Hervieu, Benoit Baudry, Arnaud Gotlieb. PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models. Proc. of Int. Symp. on Soft. Reliability Engineering (ISSRE'11), Nov 2011, Hiroshima, Japan. ⟨hal-00699558⟩



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