Easy fault injection and stress testing with FAIL-FCI

William Hoarau 1 Sébastien Tixeuil 2 Fabien Vauchelles 2
2 GRAND-LARGE - Global parallel and distributed computing
LRI - Laboratoire de Recherche en Informatique, LIFL - Laboratoire d'Informatique Fondamentale de Lille, UP11 - Université Paris-Sud - Paris 11, Inria Saclay - Ile de France, CNRS - Centre National de la Recherche Scientifique : UMR8623
Abstract : In a network consisting of several thousands computers, the occurrence of faults is unavoid- able. Being able to test the behavior of a distributed program in an environment where we can control the faults (such as the crash of a process) is an important feature that matters in the deployment of reliable programs. In this paper, we extend FAIL-FCI (for Fault Injection Language, and FAIL Cluster Im- plementation, respectively), a software tool that permits to elaborate complex fault scenarios in a simple way, while relieving the user from writing low level code. In particular, we show that not only we are able to fault-load existing distributed applications (as used in most cur- rent papers that address fault-tolerance issues), we are also able to inject qualitative faults, i.e. inject speci¯c faults at very speci¯c moments in the program code of the application under test. Finally, and although this was not the primary purpose of the tool, we are also able to inject speci¯c patterns of workload, in order to stress test the application under test. Interestingly enough, the whole process is driven by a simple uni¯ed description language, that is totally independent from the language of the application, so that no code changes or recompilation are needed on the application side.
Type de document :
[Research Report] RR1421, 2006, pp.20
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Soumis le : lundi 21 mai 2012 - 16:54:27
Dernière modification le : jeudi 11 janvier 2018 - 06:22:14


  • HAL Id : hal-00699867, version 1


William Hoarau, Sébastien Tixeuil, Fabien Vauchelles. Easy fault injection and stress testing with FAIL-FCI. [Research Report] RR1421, 2006, pp.20. 〈hal-00699867〉



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