Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution

Mahdi Bagher 1 Cyril Soler 1 Nicolas Holzschuch 1
1 MAVERICK - Models and Algorithms for Visualization and Rendering
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, INPG - Institut National Polytechnique de Grenoble
Abstract : Material models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook- Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.
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Computer Graphics Forum, Wiley, 2012, 31 (4), pp.1509-1518. <10.1111/j.1467-8659.2012.03147.x>
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Mahdi Bagher, Cyril Soler, Nicolas Holzschuch. Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution. Computer Graphics Forum, Wiley, 2012, 31 (4), pp.1509-1518. <10.1111/j.1467-8659.2012.03147.x>. <hal-00702304>

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