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Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution
Abstract : Material models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook- Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.
https://hal.inria.fr/hal-00702304
Contributor : Nicolas Holzschuch <>
Submitted on : Friday, June 1, 2012 - 11:01:05 AM
Last modification on : Friday, July 3, 2020 - 4:49:11 PM
Document(s) archivé(s) le : Friday, November 30, 2012 - 1:05:13 PM
Contributor : Nicolas Holzschuch <>
Submitted on : Friday, June 1, 2012 - 11:01:05 AM
Last modification on : Friday, July 3, 2020 - 4:49:11 PM
Document(s) archivé(s) le : Friday, November 30, 2012 - 1:05:13 PM
