Smriti Joshi, Anne Lombardot, Marc Belleville, Edith Beigné, Stéphane Girard. A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits.
DATE 2013 - Design, Automation and Test in Europe, Mar 2013, Grenoble, France. pp.1056-1057,
⟨10.7873/DATE.2013.221⟩.
⟨hal-00805478⟩