| HAL-Inria | Publications, software ... of Inria's scientists |
Journal articles
On the identification of defects in a periodic waveguide from far field data
Abstract : The aim of this paper is to apply the Linear Sampling Method and the Factorization Method to retrieve some defects in a known periodic 2D waveguide from scattering data. More precisely, some far field approximations of these two sampling methods are derived. They amount to consider the so-called propagating Floquet modes as incident waves. The efficiency of the far field formulation of the LSM is shown with the help of some numerical experiments.
https://hal.inria.fr/hal-00914674
Contributor : Sonia Fliss <>
Submitted on : Monday, September 1, 2014 - 10:53:07 AM
Last modification on : Thursday, January 14, 2021 - 11:56:04 AM
Long-term archiving on: : Tuesday, December 2, 2014 - 10:11:16 AM
Contributor : Sonia Fliss <>
Submitted on : Monday, September 1, 2014 - 10:53:07 AM
Last modification on : Thursday, January 14, 2021 - 11:56:04 AM
Long-term archiving on: : Tuesday, December 2, 2014 - 10:11:16 AM
Files
article_bourgeois_fliss_rev_co...
Files produced by the author(s)