Model Based Testing for Concurrent Systems with Labeled Event Structures

Hernán Ponce de León 1, 2, * Stefan Haar 2 Delphine Longuet 3
* Auteur correspondant
1 MEXICO - Modeling and Exploitation of Interaction and Concurrency
LSV - Laboratoire Spécification et Vérification [Cachan], ENS Cachan - École normale supérieure - Cachan, Inria Saclay - Ile de France, CNRS - Centre National de la Recherche Scientifique : UMR8643
3 ForTesse
LRI - Laboratoire de Recherche en Informatique
Abstract : We propose a theoretical testing framework and a test generation algorithm for concurrent systems specified with true concurrency models, such as Petri nets or networks of automata. The semantic model of computation of such formalisms are labeled event structures, which allow to represent concurrency explicitly. We introduce the notions of strong and weak concurrency: strongly concurrent events must be concurrent in the implementation, while weakly concurrent ones may eventually be ordered. The ioco type conformance relations for sequential systems rely on the observation of sequences of actions and blockings, thus they are not capable of capturing and exploiting concurrency of non sequential behaviors. We propose an extension of ioco for labeled event structures, named co-ioco, allowing to deal with strong and weak concurrency. We extend the notions of test cases and test execution to labeled event structures, and give a test generation algorithm building a complete test suite for co-ioco.
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Article dans une revue
Journal of Software Testing, Verification, and Reliability, John Wiley & Sons, 2014, Tests and Proofs in Model-based Testing, 24 (7), pp.558-590. 〈10.1002/stvr.1543〉
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Soumis le : lundi 26 janvier 2015 - 10:41:59
Dernière modification le : jeudi 5 avril 2018 - 16:31:21

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Hernán Ponce de León, Stefan Haar, Delphine Longuet. Model Based Testing for Concurrent Systems with Labeled Event Structures. Journal of Software Testing, Verification, and Reliability, John Wiley & Sons, 2014, Tests and Proofs in Model-based Testing, 24 (7), pp.558-590. 〈10.1002/stvr.1543〉. 〈hal-00914796v3〉

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