Digital calibration incorporating redundancy of flash adcs, IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol.50, issue.5, pp.50-205, 2003. ,
DOI : 10.1109/TCSII.2003.811435
Highly Interleaved 5-bit, 250-MSample/s, 1.2-mW ADC With Redundant Channels in 65-nm CMOS, IEEE Journal of Solid-State Circuits, vol.43, issue.12, pp.43-2641, 2008. ,
DOI : 10.1109/JSSC.2008.2006334
Matching Properties of MOS Transistors, IEEE J. of Solid-State Circuits, pp.24-1433, 1989. ,