Deriving Usage Model Variants for Model-based Testing: An Industrial Case Study

Hamza Samih 1, 2, * Mathieu Acher 1 Ralf Bogusch 3 Hélène Le Guen 2 Benoit Baudry 1
* Auteur correspondant
1 DiverSe - Diversity-centric Software Engineering
Inria Rennes – Bretagne Atlantique , IRISA-D4 - LANGAGE ET GÉNIE LOGICIEL
2 ALL4TEC RD [Laval]
3 Airbus
Airbus Group [Germany]
Abstract : The strong cost pressure of the market and safety issues faced by aerospace industry affect the development. Suppliers are forced to continuously optimize their life-cycle processes to facilitate the development of variants for different customers and shorten time to market. Additionally, industrial safety standards like RTCA/DO-178C require high efforts for testing single products. A suitably organized test process for Product Lines (PL) can meet standards. In this paper, we propose an approach that adopts Model-based Testing (MBT) for PL. Usage models, a widely used MBT formalism that provides automatic test case generation capabilities, are equipped with variability information such that usage model variants can be derived for a given set of features. The approach is integrated in the professional MBT tool MaTeLo. We report on our experience gained from an industrial case study in the aerospace domain.
Keywords : Usage Model Product Line Orthogonal Variability Model Requirements Model-based Testing
Type de document :
Communication dans un congrès
19th International Conference on Engineering of Complex Computer Systems (ICECCS 2014), Aug 2014, Tianjin, China. IEEE, 2014
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https://hal.inria.fr/hal-01002099
Contributeur : Hamza Samih <>
Soumis le : jeudi 5 juin 2014 - 15:30:16
Dernière modification le : jeudi 9 février 2017 - 16:02:43
Document(s) archivé(s) le : vendredi 5 septembre 2014 - 11:55:57

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Hamza Samih, Mathieu Acher, Ralf Bogusch, Hélène Le Guen, Benoit Baudry. Deriving Usage Model Variants for Model-based Testing: An Industrial Case Study. 19th International Conference on Engineering of Complex Computer Systems (ICECCS 2014), Aug 2014, Tianjin, China. IEEE, 2014. <hal-01002099>

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