Abstract : Timing failures in high complexity - high frequency
integrated circuits, which are mainly caused by test escapes and
environmental as well as operating conditions, are a real concern in
nanometer technologies. The Time Dilation design technique supports both
on-line (concurrent) error detection/correction and off-line scan
testing. It is based on a new scan Flip-Flop and provides multiple error
detection and correction at the minimum penalty of one clock cycle delay
at the normal circuit operation for each error correction. No extra
memory elements are required, like in earlier design approaches in the
open literature, reducing drastically the silicon area overhead, while
the performance degradation is negligible since no extra circuitry is
inserted in the critical paths of a design.
https://hal.inria.fr/hal-01054274
Contributor : Hal Ifip
<>
Submitted on : Tuesday, August 5, 2014 - 5:02:05 PM
Last modification on : Friday, December 1, 2017 - 1:16:01 AM
Document(s) archivé(s) le : Wednesday, November 26, 2014 - 12:36:39 AM
Andreas Floros, Yiorgos Tsiatouhas, Xrysovalantis Kavousianos. Timing Error Detection and Correction by Time
Dilation. Christian Piguet; Ricardo Reis; Dimitrios Soudris. 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2008, Rhodes Island, India. Springer, IFIP Advances in Information and Communication Technology, AICT-313, pp.271-285, 2010, VLSI-SoC: Design Methodologies for SoC and SiP. 〈10.1007/978-3-642-12267-5_15〉. 〈hal-01054274〉
