Fundamental principles of engineering nanometrology, 2009. ,
A fully traceable miniature CMM with sub-micrometre uncertainty, Proc. SPIE 5190, pp.265-276, 2003. ,
Probing Systems in Dimensional Metrology, CIRP Annals - Manufacturing Technology, vol.53, issue.2, pp.657-684, 2004. ,
DOI : 10.1016/S0007-8506(07)60034-1
Modelling and prototyping the conceptual design of 3D CMM micro-probe, 2008 2nd Electronics Systemintegration Technology Conference, pp.193-198, 2008. ,
DOI : 10.1109/ESTC.2008.4684348
Investigating scaling limits of a fibre based resonant probe for metrology applications, Proc. 12 th ICPE, 2008. ,
Capillary forces in microassembly, 2007. ,
DOI : 10.1007/978-0-387-71089-1
Assembly of Microsystems, CIRP Annals - Manufacturing Technology, vol.49, issue.2, pp.451-472, 2000. ,
DOI : 10.1016/S0007-8506(07)63450-7
Force controlled pushing of nanoparticles: modeling and experiments, 1999 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Cat. No.99TH8399), pp.13-20, 1999. ,
DOI : 10.1109/AIM.1999.803136
Aqueous processing of WC-Co powders, Royal Institute of Technology, 2004. ,
Adhesion forces reduction for micro manipulation based on microphysics, Proc IEEE 9 th Annual International Workshop on MEMS, pp.11-15, 1996. ,
Range, Physical Review Letters, vol.78, issue.1, pp.5-8, 1997. ,
DOI : 10.1103/PhysRevLett.78.5
Compact models for squeeze-film damping in the slip flow regime, NSTI-Nanotech 2, pp.243-246, 2004. ,
Tables of Physical and Chemical Constants, Journal of the R??ntgen Society, vol.17, issue.67, 1995. ,
DOI : 10.1259/jrs.1921.0043