M. Robson and G. Russell, Current monitoring technique for testing embedded analogue functions in mixed signal ICs, Electronics Letters, pp.796-798, 1996.
DOI : 10.1049/el:19960557

S. Sabade and D. M. Walker, -based test methods, ACM Transactions on Design Automation of Electronic Systems, vol.9, issue.2, pp.159-198, 2004.
DOI : 10.1145/989995.989997

B. Alorda, V. Canals, and J. Segura, A Two-Level Power-Grid Model for Transient Current Testing Evaluation, Journal of Electronic Testing, vol.20, issue.5, pp.543-552, 2004.
DOI : 10.1023/B:JETT.0000042518.15795.f0

Y. Maidon, Y. Deval, J. B. Begueret, J. Tomas, and J. P. Dom, In 3.3V CMOS Built-In Current Sensor, IEE Electronics Letters, pp.345-346, 1997.
URL : https://hal.archives-ouvertes.fr/hal-00183171

V. Stopjaková, H. Manhaeve, and M. Sidiropulos, In On-Chip Transient Current Monitor for Testing of Low-Voltage CMOS IC, Proceedings of Design, Automation and Test in Europe, pp.538-542, 1999.

J. Segura, D. Paul, I. Roca, M. Isern, E. Hawkins et al., Experimental analysis of transient current testing based on charge observation, Electronic Letter, pp.441-447, 1999.
DOI : 10.1049/el:19990359

R. Mozuelos, N. Peláez, M. Martínez, and S. Bracho, In Built-in Current Sensor in Mixed Circuit Test Based on Dynamic Power Supply Consumption, IEEE International On-Line Testing Workshop, pp.25-28, 1996.

R. Mozuelos, M. Martínez, and S. Bracho, In Built-In Sensor Based on the Time Variation of the Transient Current Supply in Analogue Circuits, XVI Conference on Design of Circuits and Integrated Systems, pp.630-635, 2001.

Y. Lechuga, R. Mozuelos, M. Martínez, and S. Bracho, Built-in dynamic current sensor for hard-to-detect faults in mixed-signal ICs, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition, pp.205-211, 2002.
DOI : 10.1109/DATE.2002.998271

Y. Lechuga, R. Mozuelos, M. Martínez, and S. Bracho, Built-in sensor based on current supply high-frequency behaviour, IEE Electronics Letters, pp.775-777, 2003.
DOI : 10.1049/el:20030475

J. Segura and C. Hawkins, CMOS Electronics: How it Works, How it Fails, p.12, 2004.
DOI : 10.1002/0471728527

D. Arumí, R. Rodríguez-montañés, and J. Figueras, Experimental Characterization of CMOS Interconnect Open Defects, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.27, issue.1, pp.123-136, 2008.
DOI : 10.1109/TCAD.2007.907255

T. Olbrich, R. Mozuelos, A. Richardson, and S. Bracho, Design-for-test (DfT) study on a current mode DAC, IEE Proceedings Circuits, Devices and Systems, pp.374-379, 1996.
DOI : 10.1049/ip-cds:19960956

R. Mozuelos, Y. Lechuga, M. A. Allende, M. Martínez, and S. Bracho, In Experimental Evaluation of a Built-in Current Sensor for Analog Circuits, Design of Circuits and Integrated Systems Conference, pp.96-100, 2004.