Test generation with SMT solvers in Model Based Testing

Jérome Cantenot 1 Fabrice Ambert 1 Fabrice Bouquet 2, 1
2 CASSIS - Combination of approaches to the security of infinite states systems
FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174), Inria Nancy - Grand Est, LORIA - FM - Department of Formal Methods
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https://hal.inria.fr/hal-01093461
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Submitted on : Wednesday, December 10, 2014 - 4:30:08 PM
Last modification on : Tuesday, December 18, 2018 - 4:38:25 PM

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Jérome Cantenot, Fabrice Ambert, Fabrice Bouquet. Test generation with SMT solvers in Model Based Testing. Journal of Software Testing, Verification, and Reliability, John Wiley & Sons, 2014, 24 (7), pp.33. ⟨10.1002/stvr.1537⟩. ⟨hal-01093461⟩

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