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Article Dans Une Revue International Journal of Optomechatronics Année : 2015

Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process

Résumé

A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article 1. Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models.
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Dates et versions

hal-01241405 , version 1 (10-12-2015)

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Le Cui, Eric Marchand. Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process. International Journal of Optomechatronics, 2015, 9 (2), pp.151-169. ⟨10.1080/15599612.2015.1034903⟩. ⟨hal-01241405⟩
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