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Visual quality inspection and fine anomalies: methods and application

Simon-Frédéric Desage 1 Gilles Pitard 1 Maurice Pillet 1 Hugues Favrelière 1 Fabrice Frelin 1 Serge Samper 2, 1 Gaëtan Le Goïc 3, 1 Laurent Gwinner 4 Pierre Jochum 4
1 SYMME - Laboratoire SYstèmes et Matériaux pour la MEcatronique
2 LARMAUR - LAboratoire de Recherche en Mécanique Appliquée
3 Le2i - Laboratoire Electronique, Informatique et Image [UMR6306]
4 CETEHOR [Département technique du Comité FRANCECLAT]
Abstract : This study develops a surface inspection methodology used to detect complex geometry products and metallic reflective surfaces imperfections. This work is based on combination of three complementary methods: an optical one (structured light information), an algorithmic one (data processing) and a statistical one (parameters processing). A usual industrial application illustrates this processing.
Keywords : Surface metrology Quality Inspection Image Processing Computer Vision Statistic
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Submitted on : Friday, January 22, 2016 - 4:35:37 PM
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CNRS | UNIV-BOURGOGNE | UNIV-RENNES1 | LE2I | LARMAUR | IPR | UNIV-SAVOIE | SYMME | UGA | IFIP-AICT-435 | IFIP-AICT | IFIP | IFIP-TC5 | IFIP-TC | IFIP-WG | IFIP-WG5-5 | UR1-UFR-SPM | OSUR | UNIV-RENNES | UNIV-HESAM | ARTS-ET-METIERS-SCIENCES-ET-TECHNOLOGIES

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Simon-Frédéric Desage, Gilles Pitard, Maurice Pillet, Hugues Favrelière, Fabrice Frelin, et al.. Visual quality inspection and fine anomalies: methods and application. Svetan Ratchev. Precision Assembly Technologies and Systems : 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers, AICT-435, Springer, pp.94-106, 2014, IFIP Advances in Information and Communication Technology, 978-3-662-45585-2. ⟨10.1007/978-3-662-45586-9_13⟩. ⟨hal-01260893⟩

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