Visual quality inspection and fine anomalies: methods and application

This study develops a surface inspection methodology used to detect complex geometry products and metallic reflective surfaces imperfections. This work is based on combination of three complementary methods: an optical one (structured light information), an algorithmic one (data processing) and a statistical one (parameters processing). A usual industrial application illustrates this processing.

Keywords

Computer Vision Image Processing Statistic Quality Inspection Surface metrology

Domains

Computer Science [cs]

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978-3-662-45586-9_13_Chapter.pdf (418.92 Ko)

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https://hal.inria.fr/hal-01260893

Submitted on : Friday, January 22, 2016-4:35:37 PM

Last modification on : Friday, August 5, 2022-2:54:00 PM

Long-term archiving on: Saturday, April 23, 2016-10:57:43 AM

Dates and versions

hal-01260893 , version 1 (22-01-2016)

Licence

Attribution - CC BY 4.0

Identifiers

HAL Id : hal-01260893 , version 1
DOI : 10.1007/978-3-662-45586-9_13

Cite

Simon-Frédéric Desage, Gilles Pitard, Maurice Pillet, Hugues Favrelière, Fabrice Frelin, et al.. Visual quality inspection and fine anomalies: methods and application. Svetan Ratchev. Precision Assembly Technologies and Systems : 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers, AICT-435, Springer, pp.94-106, 2014, IFIP Advances in Information and Communication Technology, 978-3-662-45585-2. ⟨10.1007/978-3-662-45586-9_13⟩. ⟨hal-01260893⟩

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