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Conference papers
Three-Dimensional Visual Tracking and Pose Estimation in Scanning Electron Microscopes
Abstract : Visual tracking and estimation of the 3D posture of a micro/nano-object is a key issue in the development of automated manipulation tasks using the visual feedback. The 3D posture of the micro-object is estimated based on a template matching algorithm. Nevertheless, a key challenge for visual tracking in a scanning electron microscope (SEM) is the difficulty to observe the motion along the depth direction. In this paper, we propose a template-based hybrid visual tracking scheme that uses luminance information to estimate the object displacement on x-y plane and uses defocus information to es- timate object depth. This approach is experimentally validated on 4-DoF motion of a sample in a SEM.
Cited literature [15 references]
https://hal.inria.fr/hal-01355393
Contributor : Eric Marchand <>
Submitted on : Tuesday, August 23, 2016 - 2:09:10 PM
Last modification on : Wednesday, May 19, 2021 - 12:06:26 PM
Long-term archiving on: : Thursday, November 24, 2016 - 12:37:30 PM
Contributor : Eric Marchand <>
Submitted on : Tuesday, August 23, 2016 - 2:09:10 PM
Last modification on : Wednesday, May 19, 2021 - 12:06:26 PM
Long-term archiving on: : Thursday, November 24, 2016 - 12:37:30 PM
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2016_iros_cui.pdf
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