Abstract : Multi shaped beam lithography requires the precise and durable alignment and fixation of MEMS based Multi Deflection Arrays on stable ceramic system platforms using vacuum and high temperature compatible interconnection and joining technologies. Micron accuracy during assembly is accomplished by mark detection using image processing and 3DOF alignment procedures; while interconnection as well as precise fixation is carried out using a fine pitch solder bumping process. Qualification investigations using electron beam equipment show that the precisely aligned multi shaped beam arrays are able to deflect the electron beams in accordance with the simulation results.
Svetan Ratchev. 6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. Springer, IFIP Advances in Information and Communication Technology, AICT-371, pp.42-50, 2012, Precision Assembly Technologies and Systems. 〈10.1007/978-3-642-28163-1_6〉
https://hal.inria.fr/hal-01363878
Contributeur : Hal Ifip
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Dernière modification le : lundi 12 septembre 2016 - 14:22:52
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Matthias Mohaupt, Erik Beckert, Thomas Burkhardt, Marcel Hornaff, Christoph Damm, et al.. Precisely Assembled Multi Deflection Arrays – Key Components for Multi Shaped Beam Lithography. Svetan Ratchev. 6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. Springer, IFIP Advances in Information and Communication Technology, AICT-371, pp.42-50, 2012, Precision Assembly Technologies and Systems. 〈10.1007/978-3-642-28163-1_6〉. 〈hal-01363878〉
