Abstract : A micro coordinate measurement machine (micro-CMM) with high precision and high accuracy is introduced for the measurement of part dimensions in micro scale. This design is intended to achieve submicron resolution for a work envelop of at least (100x100x100) mm. In this study, a mathematical measuring model to explicitly define the coordinate of the probe in x, y and z directions have been represented. An algorithm to find the workspace was implemented. The error model of the machine was created and the effect of structural errors on probe position was studied analytically. The significance of each geometric parameter was studied in order to minimize the measuring error and achieve the best machine design. Finally, the results of the analytical error model were confirmed through a Monte Carlo analysis.
Svetan Ratchev. 6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. Springer, IFIP Advances in Information and Communication Technology, AICT-371, pp.105-117, 2012, Precision Assembly Technologies and Systems. 〈10.1007/978-3-642-28163-1_14〉
https://hal.inria.fr/hal-01363891
Contributeur : Hal Ifip
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Soumis le : lundi 12 septembre 2016 - 10:06:13
Dernière modification le : lundi 12 septembre 2016 - 14:22:50
Document(s) archivé(s) le : mardi 13 décembre 2016 - 12:37:31
Ali Rugbani, Kristiaan Schreve. Modelling and Analysis of the Geometrical Errors of a Parallel Manipulator Micro-CMM. Svetan Ratchev. 6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. Springer, IFIP Advances in Information and Communication Technology, AICT-371, pp.105-117, 2012, Precision Assembly Technologies and Systems. 〈10.1007/978-3-642-28163-1_14〉. 〈hal-01363891〉
