M. L. Bushnell and V. D. Agrawal, Essential of Electronic Testing, 2000.

S. Thatte and J. Abraham, Test Generation for Microprocessors, IEEE Transactions on Computers, pp.429-441, 1980.
DOI : 10.1109/TC.1980.1675602
URL : http://www.dtic.mil/get-tr-doc/pdf?AD=ADA085078

M. Psarakis, D. Gizopoulos, E. Sanchez, and M. Sonza-reorda, Microprocessor Software-Based Self-Testing, IEEE Design & Test of Computers, vol.27, issue.3, pp.4-19, 2010.
DOI : 10.1109/MDT.2010.5

M. Hatzimihail, M. Psarakis, D. Gizopoulos, and A. Paschalis, A methodology for detecting performance faults in microprocessors via performance monitoring hardware, 2007 IEEE International Test Conference, pp.1-10, 2007.
DOI : 10.1109/TEST.2007.4437646

S. Almukhaizim, P. Petrov, and A. Orailoglu, Low-cost, software-based self-test methodologies for performance faults in processor control subsystems, Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169), pp.263-266, 2001.
DOI : 10.1109/CICC.2001.929769

M. Hatzimihail, M. Psarakis, D. Gizopoulos, and A. Paschalis, A methodology for detecting performance faults in microprocessors via performance monitoring hardware, 2007 IEEE International Test Conference, pp.1-10, 2007.
DOI : 10.1109/TEST.2007.4437646

T. Hsieh, M. A. Breuer, M. Annavaram, S. K. Gupta, and K. Lee, Tolerance of performance degrading faults for effective yield improvement, 2009 International Test Conference, pp.1-10, 2009.
DOI : 10.1109/TEST.2009.5355594

S. Almukhaizim and O. Sinanoglu, Error-resilient design of branch predictors for effective yield improvement, 2011 12th Latin American Test Workshop (LATW), pp.1-6, 2011.
DOI : 10.1109/LATW.2011.5985910

A. J. Van-de-goor, Testing Semiconductor Memories, Theory and Practice, 1991.

B. Spunt, The Basics of Performance-Monitoring Hardware, IEEE Micro, pp.64-71, 2002.

W. J. Perez, J. Velasco-medina, D. Ravotto, E. Sanchez, and M. Sonza-reorda, A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs, 2008 14th IEEE International On-Line Testing Symposium, pp.143-148, 2008.
DOI : 10.1109/IOLTS.2008.22

E. Sanchez, M. Sonza-reorda, and A. Tonda, On the functional test of Branch Prediction Units based on Branch History Table, 2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, pp.278-283, 2011.
DOI : 10.1109/VLSISoC.2011.6081650
URL : https://hal.archives-ouvertes.fr/hal-01365976

M. Grosso, M. Sonza-reorda, M. Portela-garcia, M. Garcia-valderas, C. Lopez-ongil et al., An on-line fault detection technique based on embedded debug features, 2010 IEEE 16th International On-Line Testing Symposium, pp.167-172, 2010.
DOI : 10.1109/IOLTS.2010.5560215