Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits, IEEE Transactions on Instrumentation and Measurement, vol.54, issue.3, pp.1033-1044, 2005. ,
DOI : 10.1109/TIM.2005.847115
A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis, IEEE Transactions on Instrumentation and Measurement, vol.56, issue.6, pp.2322-2329, 2007. ,
DOI : 10.1109/TIM.2007.907947
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets, Journal of Electronic Testing, vol.8, issue.2, pp.43-57, 1996. ,
DOI : 10.1007/BF00137564
URL : https://hal.archives-ouvertes.fr/hal-00013266
A Dynamic Subgradient-Based Branch-and-Bound Procedure for Set Covering, Operations Research, vol.44, issue.6, pp.875-890, 1996. ,
DOI : 10.1287/opre.44.6.875
A Greedy Heuristic for the Set-Covering Problem, Mathematics of Operations Research, vol.4, issue.3, pp.233-235, 1979. ,
DOI : 10.1287/moor.4.3.233
A lagrangian heuristic for set-covering problems, Naval Research Logistics, vol.15, issue.1, pp.151-164, 1990. ,
DOI : 10.1002/1520-6750(199002)37:1<151::AID-NAV3220370110>3.0.CO;2-2
A genetic algorithm for the set covering problem, European Journal of Operational Research, vol.94, issue.2, pp.392-404, 1996. ,
DOI : 10.1016/0377-2217(95)00159-X
OR-Library: Distributing Test Problems by Electronic Mail, Journal of the Operational Research Society, vol.41, issue.11, pp.1069-1072, 1990. ,
DOI : 10.1057/jors.1990.166
Computers and Intractability: A Guide to the Theory of NP- Completeness, Freeman, 1979. ,
Recognition, Generation, and Application of Binary Matrices with the Consecutive- Ones Property, 2008. ,
Caractérisation des matrices totalement unimodulaires, C. R. Acad. Sci. Paris, vol.254, pp.1192-1194, 1962. ,
Integral boundary points of convex polyhedra, In: Linear Inequalities and Related Systems, pp.223-246, 1956. ,
Linear Programming and Extensions, N.J, 1963. ,
DOI : 10.1515/9781400884179
A Two-Phase Support Method for Solving Linear Programs: Numerical Experiments, Mathematical Problems in Engineering, vol.10, issue.2, pp.10-1155482193, 2012. ,
DOI : 10.1007/BF01584548
New techniques for selecting test frequencies for linear analog circuits, 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC), pp.93-98, 2013. ,
DOI : 10.1109/VLSI-SoC.2013.6673256
URL : https://hal.archives-ouvertes.fr/hal-00855154
Efficient minimization of test frequencies for linear analog circuits, 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2013. ,
DOI : 10.1109/ETS.2013.6569385
URL : https://hal.archives-ouvertes.fr/hal-00789857
Une application efficace du problème de recouvrement au test de circuits analogiques, pp.424-425, 2012. ,
A hybrid direction algorithm for solving linear programs, International Journal of Computer Mathematics, vol.41, issue.7, pp.201-216, 2015. ,
DOI : 10.1155/2011/374390
Optimal Capacity Scheduling???I, Operations Research, vol.10, issue.4, pp.518-547, 1962. ,
DOI : 10.1287/opre.10.4.518
CAO Platform for mixed circuit testing, Grenoble INP, 2007. ,
CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization, In: IFIP International Federation for Information Processing, vol.249, pp.281-300, 2007. ,
DOI : 10.1007/978-0-387-74909-9_16
URL : https://hal.archives-ouvertes.fr/hal-00202160