A Physically-Based Reflectance Model Combining Reflection and Diffraction

Nicolas Holzschuch 1 Romain Pacanowski 2, 3
1 MAVERICK - Models and Algorithms for Visualization and Rendering
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, INPG - Institut National Polytechnique de Grenoble
3 MANAO - Melting the frontiers between Light, Shape and Matter
LaBRI - Laboratoire Bordelais de Recherche en Informatique, Inria Bordeaux - Sud-Ouest, LP2N - Laboratoire Photonique, Numérique et Nanosciences
Abstract : Reflectance properties express how objects in a virtual scene interact with light; they control the appearance of the object: whether it looks shiny or not, whether it has a metallic or plastic appearance. Having a good reflectance model is essential for the production of photo-realistic pictures. Measured reflectance functions provide high realism at the expense of memory cost. Parametric models are compact, but finding the right parameters to approximate measured reflectance can be difficult. Most parametric models use a model of the surface micro-geometry to predict the reflectance at the macroscopic level. In this paper, we show that this micro-geometry causes two different physical phenomena: reflection and diffraction. Their relative importance is connected to the surface roughness. Taking both phenomena into account, we develop a new reflectance model that is compact, based on physical properties and provides a good approximation of measured reflectance.
Type de document :
[Research Report] RR-8964, INRIA. 2016
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Contributeur : Romain Pacanowski <>
Soumis le : lundi 7 novembre 2016 - 17:17:21
Dernière modification le : mercredi 11 avril 2018 - 01:59:19
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  • HAL Id : hal-01386157, version 1


Nicolas Holzschuch, Romain Pacanowski. A Physically-Based Reflectance Model Combining Reflection and Diffraction. [Research Report] RR-8964, INRIA. 2016. 〈hal-01386157〉



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