A scale-adaptive method for retracing and registering in correlative light-electron microscopy.

Abstract : Correlative light-electron microscopy (CLEM) aims at a better understanding of cell mechanisms by relating dynamics with structure. However, LM and EM images are of very different size, resolution, field-of-view, appearance, usually requiring manual assistance at one or several stages. We have defined an original automated CLEM retracing-and-registration method involving a common representation with adaptive scale for both types of images, and the specification of appropriate descriptors and similarity criterion for the EM patch search.
Type de document :
Communication dans un congrès
SIAM Imaging Science, May 2016, Albuquerque, United States. 2016, 〈https://www.siam.org/meetings/is16/〉
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https://hal.inria.fr/hal-01416850
Contributeur : Charles Kervrann <>
Soumis le : mercredi 14 décembre 2016 - 22:08:29
Dernière modification le : mercredi 11 avril 2018 - 01:55:36

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  • HAL Id : hal-01416850, version 1

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Bertha Mayela Toledo Acosta, Patrick Bouthemy, Charles Kervrann. A scale-adaptive method for retracing and registering in correlative light-electron microscopy.. SIAM Imaging Science, May 2016, Albuquerque, United States. 2016, 〈https://www.siam.org/meetings/is16/〉. 〈hal-01416850〉

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