A scale-adaptive method for retracing and registering in correlative light-electron microscopy.

Abstract : Correlative light-electron microscopy (CLEM) aims at a better understanding of cell mechanisms by relating dynamics with structure. However, LM and EM images are of very different size, resolution, field-of-view, appearance, usually requiring manual assistance at one or several stages. We have defined an original automated CLEM retracing-and-registration method involving a common representation with adaptive scale for both types of images, and the specification of appropriate descriptors and similarity criterion for the EM patch search.
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Conference papers
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https://hal.inria.fr/hal-01416850
Contributor : Charles Kervrann <>
Submitted on : Wednesday, December 14, 2016 - 10:08:29 PM
Last modification on : Wednesday, April 11, 2018 - 1:55:36 AM

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Bertha Mayela Toledo Acosta, Patrick Bouthemy, Charles Kervrann. A scale-adaptive method for retracing and registering in correlative light-electron microscopy.. SIAM Imaging Science, SIAM, May 2016, Albuquerque, United States. ⟨hal-01416850⟩

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