Abstract : This paper characterizes how compiler optimizations impact software control-flow reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation induced soft-errors occurring in branches. Supported by a comprehensive fault injection campaign using an established benchmark suite in the embedded systems domain, we show that the careful selection of the available compiler optimizations is necessary to avoid a significant decrease of software reliability while sustaining the performance boost those optimizations provide.
Gunar Schirner; Marcelo Götz; Achim Rettberg; Mauro C. Zanella; Franz J. Rammig. 4th International Embedded Systems Symposium (IESS), Jun 2013, Paderborn, Germany. Springer, IFIP Advances in Information and Communication Technology, AICT-403, pp.49-60, 2013, Embedded Systems: Design, Analysis and Verification. 〈10.1007/978-3-642-38853-8_5〉
https://hal.inria.fr/hal-01466693
Contributeur : Hal Ifip
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Soumis le : lundi 13 février 2017 - 16:39:40
Dernière modification le : vendredi 1 décembre 2017 - 01:09:42
Document(s) archivé(s) le : dimanche 14 mai 2017 - 15:04:29
Rafael Parizi, Ronaldo Ferreira, Luigi Carro, Álvaro Moreira. Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software. Gunar Schirner; Marcelo Götz; Achim Rettberg; Mauro C. Zanella; Franz J. Rammig. 4th International Embedded Systems Symposium (IESS), Jun 2013, Paderborn, Germany. Springer, IFIP Advances in Information and Communication Technology, AICT-403, pp.49-60, 2013, Embedded Systems: Design, Analysis and Verification. 〈10.1007/978-3-642-38853-8_5〉. 〈hal-01466693〉
