A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction

Nicolas Holzschuch; Romain Pacanowski

doi:10.1145/3072959.3073621

Article Dans Une Revue ACM Transactions on Graphics Année : 2017

A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction

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Nicolas Holzschuch

Fonction : Auteur
PersonId : 502
IdHAL : nicolas-holzschuch
ORCID : 0000-0002-5673-6960
IdRef : 136663982

Models and Algorithms for Visualization and Rendering

Romain Pacanowski

Fonction : Auteur
PersonId : 1285
IdHAL : romain-pacanowski
ORCID : 0000-0002-5222-4626
IdRef : 137731086

Laboratoire Photonique, Numérique et Nanosciences

Melting the frontiers between Light, Shape and Matter

Résumé

Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances.

Mots clés

diffraction material models CCS Concepts: Computing methodologies → Reflectance modeling BRDF

Domaines

Synthèse d'image et réalité virtuelle [cs.GR]

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https://inria.hal.science/hal-01515948

Soumis le : mercredi 10 mai 2017-16:07:56

Dernière modification le : jeudi 4 avril 2024-18:24:07

Dates et versions

hal-01515948 , version 1 (10-05-2017)

Identifiants

HAL Id : hal-01515948 , version 1
DOI : 10.1145/3072959.3073621

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Nicolas Holzschuch, Romain Pacanowski. A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction. ACM Transactions on Graphics, 2017, 36 (4), pp.12. ⟨10.1145/3072959.3073621⟩. ⟨hal-01515948⟩

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A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction

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