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Fine-Grained Hardware Mitigation for Multiple Long-Duration Transients on VLIW Function Units

Abstract : Technology scaling makes hardware more susceptible to radiation, which can cause multiple transient faults with long duration. In these cases, the affected function unit is usually considered as faulty and is not further used. To reduce this performance degradation, the proposed hardware mechanism detects the faults that are still active during execution and re- schedules the instructions to use the fault-free components of the affected function units. The results show multiple long-duration fault mitigation with low performance, area, and power overhead.
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https://hal.inria.fr/hal-01941860
Contributor : Olivier Sentieys <>
Submitted on : Sunday, December 2, 2018 - 5:05:30 PM
Last modification on : Friday, July 10, 2020 - 4:01:39 PM
Document(s) archivé(s) le : Sunday, March 3, 2019 - 1:45:40 PM

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Rafail Psiakis, Angeliki Kritikakou, Olivier Sentieys. Fine-Grained Hardware Mitigation for Multiple Long-Duration Transients on VLIW Function Units. DATE 2019 - 22nd IEEE/ACM Design, Automation and Test in Europe, Mar 2019, Florence, Italy. pp.976-979, ⟨10.23919/DATE.2019.8714899⟩. ⟨hal-01941860⟩

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