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Conference Papers Year : 2018

Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene

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Computer Science [cs] Modeling and Simulation Chemical Sciences Material chemistry Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

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Submitted on : Tuesday, January 8, 2019-2:28:55 PM

Last modification on : Tuesday, February 7, 2023-2:45:02 PM

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hal-01973626 , version 1 (08-01-2019)

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Cyril Guedj, Léonard Jaillet, François Rousse, Stephane Redon. Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018 - 8th International Conference on Simulation and Modeling Methodologies, Technologies and Applications, Jul 2018, Porto, Portugal. ⟨10.5220/0006829200150024⟩. ⟨hal-01973626⟩

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