Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene

Cyril Guedj 1 Léonard Jaillet 2 François Rousse 2 Stephane Redon 2
1 DTSI - Département des Technologies Silicium
2 NANO-D - Algorithms for Modeling and Simulation of Nanosystems
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, INPG - Institut National Polytechnique de Grenoble
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https://hal.inria.fr/hal-01973626
Contributor : Nano-D Equipe <>
Submitted on : Tuesday, January 8, 2019 - 2:28:55 PM
Last modification on : Monday, February 25, 2019 - 4:34:22 PM

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Cyril Guedj, Léonard Jaillet, François Rousse, Stephane Redon. Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018 - 8th International Conference on Simulation and Modeling Methodologies, Technologies and Applications, Jul 2018, Porto, Portugal. ⟨10.5220/0006829200150024⟩. ⟨hal-01973626⟩

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