Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene - Archive ouverte HAL Access content directly
Conference Papers Year : 2018

Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene

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hal-01973626 , version 1 (08-01-2019)

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Cyril Guedj, Léonard Jaillet, François Rousse, Stephane Redon. Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018 - 8th International Conference on Simulation and Modeling Methodologies, Technologies and Applications, Jul 2018, Porto, Portugal. ⟨10.5220/0006829200150024⟩. ⟨hal-01973626⟩
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