Conference Papers
Year : 2018
Nano-D Equipe : Connect in order to contact the contributor
https://hal.inria.fr/hal-01973626
Submitted on : Tuesday, January 8, 2019-2:28:55 PM
Last modification on : Tuesday, February 7, 2023-2:45:02 PM
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- HAL Id : hal-01973626 , version 1
- DOI : 10.5220/0006829200150024
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Cyril Guedj, Léonard Jaillet, François Rousse, Stephane Redon. Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018 - 8th International Conference on Simulation and Modeling Methodologies, Technologies and Applications, Jul 2018, Porto, Portugal. ⟨10.5220/0006829200150024⟩. ⟨hal-01973626⟩
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