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Conference papers
Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene
Cyril Guedj
1
Léonard Jaillet
2
François Rousse
2
Stephane Redon
2
2
NANO-D - Algorithms for Modeling and Simulation of Nanosystems
Inria Grenoble - Rhône-Alpes, Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology, LJK - Laboratoire Jean Kuntzmann
Cyril Guedj 1
Author Employer institution : Commissariat à l'énergie atomique et aux énergies alternatives
Léonard Jaillet 2
Author
François Rousse 2
Author IdHAL : francois-rousse ORCID : https://orcid.org/0000-0002-6098-721X
Stephane Redon 2
Author
1
DTSI - Département des Technologies Silicium (Grenoble - France)
- CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information : DRT/LETI (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)
- DRT (CEA) - Direction de Recherche Technologique (CEA) : DRT (France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DRT (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
- DRT (CEA) - Direction de Recherche Technologique (CEA) : DRT (France)
2
NANO-D - Algorithms for Modeling and Simulation of Nanosystems (Inria GIANT DRT/LETI/DACLE Batiment 51C - Minatec Campus 17 rue des Martyrs 38054 Grenoble Cedex - France)
- Inria Grenoble - Rhône-Alpes (Inovallée
655 avenue de l'Europe
38330 Montbonnot - France)
- Inria - Institut National de Recherche en Informatique et en Automatique (Domaine de Voluceau Rocquencourt - BP 105 78153 Le Chesnay Cedex - France)
- Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology (46 avenue Félix Viallet 38031 Grenoble Cedex 1 - France)
- LJK - Laboratoire Jean Kuntzmann (Bâtiment IMAG, CS 40700, F-38058 Grenoble Cedex 9 - France)
- Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology (46 avenue Félix Viallet 38031 Grenoble Cedex 1 - France)
- Inria - Institut National de Recherche en Informatique et en Automatique (Domaine de Voluceau Rocquencourt - BP 105 78153 Le Chesnay Cedex - France)
- CNRS - Centre National de la Recherche Scientifique (France)
- UGA [2016-2019] - Université Grenoble Alpes [2016-2019] (CS 40700 - 38058 Grenoble cedex - France)
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Conference papers
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https://hal.inria.fr/hal-01973626
Contributor : Nano-D Equipe <>
Submitted on : Tuesday, January 8, 2019 - 2:28:55 PM
Last modification on : Tuesday, November 24, 2020 - 5:04:04 PM
Contributor : Nano-D Equipe <>
Submitted on : Tuesday, January 8, 2019 - 2:28:55 PM
Last modification on : Tuesday, November 24, 2020 - 5:04:04 PM
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- HAL Id : hal-01973626, version 1
- DOI : 10.5220/0006829200150024
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Citation
Cyril Guedj, Léonard Jaillet, François Rousse, Stephane Redon. Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018 - 8th International Conference on Simulation and Modeling Methodologies, Technologies and Applications, Jul 2018, Porto, Portugal. ⟨10.5220/0006829200150024⟩. ⟨hal-01973626⟩
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