A Fundamental Study on the Effect of Visual Guidance to Inspectors Using Visual Indicator on Defect Detection in Visual Inspection Utilizing Peripheral Vision - Inria - Institut national de recherche en sciences et technologies du numérique Accéder directement au contenu
Communication Dans Un Congrès Année : 2018

A Fundamental Study on the Effect of Visual Guidance to Inspectors Using Visual Indicator on Defect Detection in Visual Inspection Utilizing Peripheral Vision

Ryosuke Nakajima
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Kosuke Fujie
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Takuya Hida
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Toshiyuki Matsumoto
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Résumé

In recent years, it is reported that a number of inspectors in the visual inspection process of industrial products utilized not only the central vision but also the peripheral vision. The visual inspection has been realized with both efficiency and accuracy. However, for the inspectors of many manufacturing industries to adopt this method, visual guidance is necessary for visual attention. Therefore, to obtain the fundamental knowledge for training of the visual inspection method, this study considers the effect of visual guidance on the defect detection performed by inspectors using visual indicators. Specifically, the presence or absence of visual guidance, defect location, and defect characteristics (luminance contrast between defect and inspection model and size) are designed as experimental factors. Further, the effect on inspection accuracy is evaluated with six subjects. As a result, it is clarified that the presence or absence of visual guidance does not affect the defect detection regardless of the defect location and defect characteristics. That is, the visual guidance is not an impediment to inspection accuracy; it is suggested that the visual guidance is an effective tool for the education and training of the visual inspection method utilizing peripheral vision.
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hal-02177880 , version 1 (09-07-2019)

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Ryosuke Nakajima, Kosuke Fujie, Takuya Hida, Toshiyuki Matsumoto. A Fundamental Study on the Effect of Visual Guidance to Inspectors Using Visual Indicator on Defect Detection in Visual Inspection Utilizing Peripheral Vision. IFIP International Conference on Advances in Production Management Systems (APMS), Aug 2018, Seoul, South Korea. pp.465-472, ⟨10.1007/978-3-319-99707-0_58⟩. ⟨hal-02177880⟩
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