S. Axelsson, A Preliminary Attempt to Apply Detection and Estimation Theory to Intrusion Detection, 2000.

E. Biham and A. Shamir, Differential fault analysis of secret key cryptosystems, Proceedings of the Seventeenth Annual International Cryptology Conference, pp.513-525, 1997.

G. Binnig, C. Quate, and C. Gerber, Atomic force microscope, Physical Review Letters, vol.56, pp.930-933, 1986.

G. Binnig and H. Rohrer, Scanning tunneling microscopy, Helvetica Physica Acta, vol.55, pp.726-735, 1982.

I. Bruker, , 2019.

D. Chiang, P. Lei, F. Zhang, and R. Barrowcliff, Dynamic EFM spectroscopy studies on electric force gradients of IrO 2 nanorod arrays, Nanotechnology, vol.16, issue.3, pp.35-40, 2005.

C. De-nardi, R. Desplats, P. Perdu, C. Guerin, J. Gauffier et al., Direct measurements of charge in floating gate transistor channels of flash memories using scanning capacitance microscopy, Proceedings of the Thirty-Second International Symposium on Testing and Failure Analysis, pp.86-93, 2006.

S. Garfinkel, Digital forensics research: The next 10 years, Digital Investigation, vol.7, pp.64-73, 2010.

M. Green, Why Can't Apple Decrypt Your iPhone, A Few Thoughts on Cryptography Engineering Blog, 2014.

J. Halderman, S. Schoen, N. Heninger, W. Clarkson, W. Paul et al., Lest we remember: Cold-boot attacks on encryption keys, Communications of the ACM, vol.52, issue.5, pp.91-98, 2009.

J. Kim, D. Son, M. Lee, C. Song, J. Song et al., A wearable multiplexed silicon nonvolatile memory array using nanocrystal charge confinement, Science Advances, vol.2, issue.1, 2016.

S. Kinney, Trusted Platform Module Basics: Using TPM in Embedded Systems, 2006.

P. Kocher, J. Jaffe, and B. Jun, Differential power analysis, Proceedings of the Nineteenth Annual International Cryptology Conference, pp.388-397, 1999.

D. Konopinski, Forensic Applications of Atomic Force Microscopy, Doctoral Dissertation, Department of Electronic and Electrical Engineering, 2013.

K. Lai, W. Kundhikanjana, H. Peng, Y. Cui, M. Kelly et al., Tapping mode microwave impedance microscopy, Review of Scientific Instruments, vol.80, issue.4, p.43707, 2009.

M. Maroufi, A. Fowler, A. Bazaei, and S. Moheimani, High-stroke silicon-on-insulator MEMS nanopositioner: Control design for nonraster scan atomic force microscopy, Review of Scientific Instruments, vol.86, issue.2, p.23705, 2015.

I. Mayergoyz and C. Tse, Spin-Stand Microscopy of Hard Disk Data, 2007.

J. Pineda, G. Pascual, B. Kim, and K. Lee, Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging, Application Note #8, Park Systems, 2017.

M. Ranum, Thinking about firewalls, Proceedings of the Second International Conference on Systems and Network Security and Management, 1993.

J. Rushby, A trusted computing base for embedded systems, Proceedings of the Seventh Department of Defense/National Bureau of Standards Computer Security Conference, pp.294-311, 1984.

S. Skorobogatov and R. Anderson, Optical fault induction attacks, Proceedings of the Fourth International Workshop on Cryptographic Hardware and Embedded Systems, pp.2-12, 2002.

W. Stallings, Cryptography and Network Security: Principles and Practice, 2010.

D. Oheimb, Information flow control revisited: Noninfluence = noninterference + nonleakage, Proceedings of the Ninth European Symposium on Research in Computer Security, pp.225-243, 2004.

A. Waksman and S. Sethumadhavan, Tamper evident microprocessors, Proceedings of the IEEE Symposium on Security and Privacy, pp.173-188, 2010.