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Imaging junctions of waveguides

Laurent Bourgeois 1 Jean-François Fritsch 1, 2 Arnaud Recoquillay 2
1 POEMS - Propagation des Ondes : Étude Mathématique et Simulation
Inria Saclay - Ile de France, UMA - Unité de Mathématiques Appliquées, CNRS - Centre National de la Recherche Scientifique : UMR7231
Abstract : In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.
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Submitted on : Monday, May 11, 2020 - 4:30:46 PM
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Laurent Bourgeois, Jean-François Fritsch, Arnaud Recoquillay. Imaging junctions of waveguides. Inverse Problems and Imaging , AIMS American Institute of Mathematical Sciences, 2021, ⟨10.3934/ipi.2020065⟩. ⟨hal-02567182⟩



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