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Imaging junctions of waveguides
Abstract : In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.
Cited literature [27 references]
https://hal.inria.fr/hal-02567182
Contributor : Laurent Bourgeois <>
Submitted on : Monday, May 11, 2020 - 4:30:46 PM
Last modification on : Tuesday, February 2, 2021 - 2:54:13 PM
Contributor : Laurent Bourgeois <>
Submitted on : Monday, May 11, 2020 - 4:30:46 PM
Last modification on : Tuesday, February 2, 2021 - 2:54:13 PM
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