Stochastic Battery Model for Embedded Systems

Venkat Rao Gaurav Singhal Anshul Kumar Nicolas Navet 1
1 TRIO - Real time and interoperability
INRIA Lorraine, LORIA - Laboratoire Lorrain de Recherche en Informatique et ses Applications
Abstract : This paper explores the recovery and rate capacity effect for batteries used in embedded systems. It throws new light on the battery recovery behavior, which can help determine optimum discharge profile and hence result in significant improvement in battery lifetime. Finally, it proposes a fast and accurate stochastic model which draws the positives from the earlier models and minimizes the drawbacks. Simulations conducted suggest close correspondence with experimental results and a maximum error of 2.65%.
Type de document :
Communication dans un congrès
18th International Conference on VLSI Design 2005, 2005, Calcutta/Inde, 2005
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https://hal.inria.fr/inria-00099956
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Soumis le : mardi 26 septembre 2006 - 10:12:53
Dernière modification le : jeudi 11 janvier 2018 - 06:20:06

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  • HAL Id : inria-00099956, version 1

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Venkat Rao, Gaurav Singhal, Anshul Kumar, Nicolas Navet. Stochastic Battery Model for Embedded Systems. 18th International Conference on VLSI Design 2005, 2005, Calcutta/Inde, 2005. 〈inria-00099956〉

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