Jean-Pierre Salmon, Isabelle Debled-Rennesson, Laurent Wendling. A new method to detect arcs and segments from curvature profiles.
18th International Conference on Pattern Recognition - ICPR 2006, Aug 2006, Hong-Kong, Hong Kong SAR China. pp.387 - 390,
⟨10.1109/ICPR.2006.123⟩.
⟨inria-00104414⟩