| HAL-Inria | Publications, software ... of Inria's scientists |
Conference papers
Recovering Material Reflectance from Polarization and Simulated annealing
Abstract : This paper presents a novel image-based method for estimating BRDF information. The goal is to determine the dependence of the reflected radiance on the surface orientation for any given illumination direction. The proposed method consists of two stages. In the first stage, the polarization state of light reflected from an object of unknown shape is analysed using a linear polarizer and digital camera. This is interpreted using Fresnel theory to estimate a field of surface normals. This stage of the algorithm is largely based on existing ideas. In the second stage, a 3D histogram of surface normals and measured pixel brightnesses is constructed. The BRDF is recovered by fitting an arbitrary surface to this histogram data using simulated annealing and elastica. The experiments presented in this paper show that realistic image rendering is possible based on the recovered BRDFs of smooth dielectric materials.
Cited literature [17 references]
https://hal.inria.fr/inria-00265255
Contributor : Inria Rhône-Alpes Documentation <>
Submitted on : Tuesday, March 18, 2008 - 4:30:01 PM
Last modification on : Saturday, November 11, 2017 - 7:04:02 PM
Long-term archiving on: : Friday, September 28, 2012 - 11:21:39 AM
Contributor : Inria Rhône-Alpes Documentation <>
Submitted on : Tuesday, March 18, 2008 - 4:30:01 PM
Last modification on : Saturday, November 11, 2017 - 7:04:02 PM
Long-term archiving on: : Friday, September 28, 2012 - 11:21:39 AM
File
p22.pdf
Files produced by the author(s)