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BPSK bit error outage over Nakagami-m fading channels in lognormal shadowing environments

Abstract : In this letter, we address the problem of finding a tractable expression for the bit-error outage (BEO) defined as the probability to observe a given average bit error rate (BER) over a fading channel in a shadowing environment. Our contribution is two-fold: (1) a simple yet tight approximation of the bit error probability (BEP) for binary phase shift keying (BPSK) over a frequency-flat Nakagami-m fading channel is derived, which (2) facilitates the derivation of a tight lower bound of the BEO in presence of lognormal shadowing in closed form. Theoretical results are corroborated by means of simulation results, confirming the tightness of the bounds.
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https://hal.inria.fr/inria-00404807
Contributor : Jean-Marie Gorce <>
Submitted on : Friday, July 17, 2009 - 11:11:11 AM
Last modification on : Friday, April 16, 2021 - 3:28:56 AM

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Philippe Mary, Mischa Dohler, Jean-Marie Gorce, Guillaume Villemaud, Maryline Arndt. BPSK bit error outage over Nakagami-m fading channels in lognormal shadowing environments. IEEE Communications Letters, Institute of Electrical and Electronics Engineers, 2007, 11 (7), pp.565-567. ⟨10.1109/LCOMM.2007.070241⟩. ⟨inria-00404807⟩

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