BPSK bit error outage over Nakagami-m fading channels in lognormal shadowing environments

Philippe Mary 1 Mischa Dohler 2 Jean-Marie Gorce 3, * Guillaume Villemaud 3 Maryline Arndt 1
* Auteur correspondant
3 ARES - Architectures of networks of services
Inria Grenoble - Rhône-Alpes, CITI - CITI Centre of Innovation in Telecommunications and Integration of services
Abstract : In this letter, we address the problem of finding a tractable expression for the bit-error outage (BEO) defined as the probability to observe a given average bit error rate (BER) over a fading channel in a shadowing environment. Our contribution is two-fold: (1) a simple yet tight approximation of the bit error probability (BEP) for binary phase shift keying (BPSK) over a frequency-flat Nakagami-m fading channel is derived, which (2) facilitates the derivation of a tight lower bound of the BEO in presence of lognormal shadowing in closed form. Theoretical results are corroborated by means of simulation results, confirming the tightness of the bounds.
Type de document :
Article dans une revue
IEEE Communications Letters, Institute of Electrical and Electronics Engineers, 2007, 11 (7), pp.565-567. 〈10.1109/LCOMM.2007.070241〉
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Contributeur : Jean-Marie Gorce <>
Soumis le : vendredi 17 juillet 2009 - 11:11:11
Dernière modification le : mercredi 11 avril 2018 - 02:00:02

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Philippe Mary, Mischa Dohler, Jean-Marie Gorce, Guillaume Villemaud, Maryline Arndt. BPSK bit error outage over Nakagami-m fading channels in lognormal shadowing environments. IEEE Communications Letters, Institute of Electrical and Electronics Engineers, 2007, 11 (7), pp.565-567. 〈10.1109/LCOMM.2007.070241〉. 〈inria-00404807〉

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