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Intersection Testing between an Ellipsoid and an Algebraic Surface

Abstract : This paper presents a new method on the intersection testing problem between an ellipsoid and an algebraic surface. In the new method, the testing problem is turned into a new testing problem whether a univariate polynomial has a positive or negative real root. Examples are shown to illustrate the robustness and efficiency of the new method.
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https://hal.inria.fr/inria-00518388
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Submitted on : Friday, September 17, 2010 - 11:00:56 AM
Last modification on : Thursday, February 3, 2022 - 11:15:50 AM
Long-term archiving on: : Saturday, December 18, 2010 - 2:59:49 AM

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Xiao-DiaoChen2007b.pdf
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  • HAL Id : inria-00518388, version 1

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Xiao-Diao Chen, Jun-Hai yong, Jean-Claude Paul, Jiaguang Sun. Intersection Testing between an Ellipsoid and an Algebraic Surface. Proceedings of the Tenth International Conference on Computer Aided Design and Computer Graphics (CAD-CG'07), School of Electronics Engineering and Computer Science, Peking University, Oct 2007, Beijing, China. ⟨inria-00518388⟩

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