Diagnosability for Patterns in Distributed Discrete Event Systems

Yuhong Yan 1 Lina Ye 2, 3 Philippe Dague 2, 3
3 LEO - Distributed and heterogeneous data and knowledge
UP11 - Université Paris-Sud - Paris 11, Inria Saclay - Ile de France, CNRS - Centre National de la Recherche Scientifique : UMR8623
Abstract : A pattern is a Finite State Machine that can describe rich faulty scenarios, such as the occurrence of single faults, multiple faults, multiple occurrences of a fault, or the repair of a system. In distributed systems, the events in the pattern, as well as in the system trajectories, are emitted from different components. Our approach is based on distributed simulation and communication to check the recognition of the pattern from the conclusion of local recognition of local patterns. The components communicate observable events and shared communication events, as well as their local recognition results during the checking process without sharing their local models in any way.
Type de document :
Communication dans un congrès
21st International Workshop on Principles of Diagnosis DX'10, Oct 2010, Portland, OR, United States. 2010
Liste complète des métadonnées

Littérature citée [6 références]  Voir  Masquer  Télécharger

https://hal.inria.fr/inria-00540844
Contributeur : Philippe Dague <>
Soumis le : lundi 29 novembre 2010 - 12:43:02
Dernière modification le : jeudi 5 avril 2018 - 12:30:08
Document(s) archivé(s) le : vendredi 2 décembre 2016 - 23:45:48

Fichier

AfterDX.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

  • HAL Id : inria-00540844, version 1

Collections

Citation

Yuhong Yan, Lina Ye, Philippe Dague. Diagnosability for Patterns in Distributed Discrete Event Systems. 21st International Workshop on Principles of Diagnosis DX'10, Oct 2010, Portland, OR, United States. 2010. 〈inria-00540844〉

Partager

Métriques

Consultations de la notice

287

Téléchargements de fichiers

433