Improving Test Suites for Efficient Fault Localization

Benoit Baudry 1 Franck Fleurey 1, 2 Yves Le Traon 1
1 TRISKELL - Reliable and efficient component based software engineering
IRISA - Institut de Recherche en Informatique et Systèmes Aléatoires, Inria Rennes – Bretagne Atlantique
Abstract : The need for testing-for-diagnosis strategies has been identified for a long time, but the explicit link from testing to diagnosis (fault localization) is rare. Analyzing the type of information needed for efficient fault localization, we identify the attribute (called Dynamic Basic Block) that restricts the accuracy of a diagnosis algorithm. Based on this attribute, a test-for-diagnosis criterion is proposed and validated through rigorous case studies: it shows that a test suite can be improved to reach a high level of diagnosis accuracy. So, the dilemma between a reduced testing effort (with as few test cases as possible) and the diagnosis accuracy (that needs as much test cases as possible to get more information) is partly solved by selecting test cases that are dedicated to diagnosis.
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Communication dans un congrès
28th International Conference on Software Engineering (ICSE 06), 2006, Shanghai, China. ACM, 2006
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Benoit Baudry, Franck Fleurey, Yves Le Traon. Improving Test Suites for Efficient Fault Localization. 28th International Conference on Software Engineering (ICSE 06), 2006, Shanghai, China. ACM, 2006. 〈inria-00542783〉

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