Robust Dense Matching Using Local and Global Geometric Constraints

Maxime Lhuillier 1 Long Quan 1
1 MOVI - Modeling, localization, recognition and interpretation in computer vision
GRAVIR - IMAG - Graphisme, Vision et Robotique, Inria Grenoble - Rhône-Alpes, CNRS - Centre National de la Recherche Scientifique : FR71
Abstract : A new robust dense matching algorithm is introduced. The algorithm starts from matching the most textured points, then a match propagation algorithm is developed with the best first strategy to dense matching. Next, the matching map is regularised by using the local geometric constraints encoded by planar affine applications and by using the global geometric constraint encoded by the fundamental matrix. Two most distinctive features are a match propagation strategy developed by analogy to region growing and a successive regularisation by local and global geometric constraints. The algorithm is efficient, robust and can cope with wide disparity. The algorithm is demonstrated on many real image pairs, and applications on image interpolation and a creation of novel views are also presented.
Type de document :
Communication dans un congrès
A. Sanfeliu and J.J. Villanueva and M. Vanrell and R. Alquézar and J. Crowley and Y. Shirai. 15th International Conference on Pattern Recognition (ICPR '00), Sep 2000, Barcelona, Spain. IEEE Computer Society, 1, pp.968--972, 2000, 〈10.1109/ICPR.2000.905620〉
Liste complète des métadonnées

Littérature citée [15 références]  Voir  Masquer  Télécharger

https://hal.inria.fr/inria-00590140
Contributeur : Team Perception <>
Soumis le : mardi 3 mai 2011 - 09:24:56
Dernière modification le : mercredi 11 avril 2018 - 01:53:33
Document(s) archivé(s) le : jeudi 4 août 2011 - 02:58:32

Fichiers

Icpr00.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

IMAG | INRIA | UGA

Citation

Maxime Lhuillier, Long Quan. Robust Dense Matching Using Local and Global Geometric Constraints. A. Sanfeliu and J.J. Villanueva and M. Vanrell and R. Alquézar and J. Crowley and Y. Shirai. 15th International Conference on Pattern Recognition (ICPR '00), Sep 2000, Barcelona, Spain. IEEE Computer Society, 1, pp.968--972, 2000, 〈10.1109/ICPR.2000.905620〉. 〈inria-00590140〉

Partager

Métriques

Consultations de la notice

134

Téléchargements de fichiers

450