N. J. Zimmerman, G. J. Van-boven, and A. Oosterlinck, Overview of industrial vision systems," in Industrial Applications of Image Analysis, 1983.

[. A. 21w and . Perkins, A model based vision system for industrial parts, IEEE Trans. Comput, pp.126-143, 1978.

D. Dessimoz, Recognition and handling of overlapping industrial parts, Proc. 9th Symp. Industrial Robots, 1979.

P. Rummel, A model based image analysis system for workpiece recognition, Proc. 6thInt. Conf. Pattern Recognition, pp.1014-1017, 1982.

. Hattich, Experience with two hybrid systems for the recognition of overlapping workpieces, Proc. 6th Int. Conf Pattern Recognition, pp.670-673, 1982.

A. P. Ambler, A versatile system for computer-controlled assembly, Proc. IJC'AI. Stanford CA, pp.298-307, 1973.
DOI : 10.1016/0004-3702(75)90006-5

R. C. Bolles and R. A. Cain, Recognizing and locating partially visible workpieces, Proc. IEEE Comput. Soc. Con>f Pattern Recognition add Inage Processing, pp.498-503, 1982.

. Davis, Shape Matching Using Relaxation Techniques, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol.1, issue.1, pp.60-72, 1979.
DOI : 10.1109/TPAMI.1979.4766876

]. A. Ill, V. Lux, and . Souvignicr, PVV -Un systeme de vision appliquant une strategie de Prediction-Vdrification, 4eme Congres Rec. Formes et Intell. Artificielle. Paris, pp.223-234, 1984.

J. Segen, Unsupervised feature selection for object recognition, Proc. SPIE Int, pp.132-135, 1982.

J. L. Turney, Recognizing partially hidden objects, Proceedings. 1985 IEEE International Conference on Robotics and Automation
DOI : 10.1109/ROBOT.1985.1087322

URL : http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.651.1391

W. E. Grimson and T. Lozano-perez, Recognition and localization of overlapping parts from sparse data in two and three dimensions, Proceedings. 1985 IEEE International Conference on Robotics and Automation
DOI : 10.1109/ROBOT.1985.1087320

N. Ayache, Un systeme de vision bidimensionnelle en robotique industrielle INRIA Tech. Rep, 1983.

C. Ayache and . Darmon, Reconnaissance recursive et localisation de formes planes partiellement visibles dans une image, Proc

N. Ayache, A model based vision system to identify and locate partially visible planar shapes, Proc. IEEE Conf. Comput. Vision and Pattern Recognition, pp.492-494, 1983.

D. Faugeras and M. Hebert, A 3-D recognition and positioning algorithm using geometrical matching between primitive surfaces, Proc. 8th Int. Conf Artificial Intell

J. Serra, Image Analysis and Mathematical Morphology, 1982.

N. Keskes, Application of image analysis techniques to seismic data, ICASSP '82. IEEE International Conference on Acoustics, Speech, and Signal Processing, pp.855-857, 1982.
DOI : 10.1109/ICASSP.1982.1171562

J. P. Chieze and P. Germain, Logiciel d'analyse de contours, INRIA Tech. Rep, 1979.

T. Pavlidis, Structural Pattern Recognition, 1977.
DOI : 10.1007/978-3-642-88304-0

N. Ayache, J. D. Boissonnat, B. Bollack, and B. Faverjon, Automatic handling of overlapping workpieces

N. Ayache-was-born-in-paris and F. , He graduated from the Ecole Nationale supdrieure des Mines de Saint Etienne in 1980, received the M.S. degree from the University of California, 1981. and the Docteur-lngenieur degree in computer science from the University of Paris XI, 1958.

D. Olivier and . Faugeras, 76) is the Scientific Director of the Computer Vision and Robotics group at INRIA (Institut National de Recherche en Informatique et Automatique) Le Chesnay, France, and a Senior Lecturer at the University of Paris Xl and Ecole Polytechnique. His interests are in computer vision, graphics, robotics, pattern recognition, and artificial intelligence

. Mr, Faugeras is a member of the