Robust Non-Rigid Registration to Capture Brain Shift from Intra-Operative MRI

Abstract : We present a new algorithm to register 3D pre-operative Magnetic Resonance (MR) images to intra-operative MR images of the brain which have undergone brain shift. This algorithm relies on a robust estimation of the deformation from a sparse noisy set of measured displacements. We propose a new framework to co mpute the displacement field in an iterative process, allowing the solution to gradually move from an approximation formulation (minimizing the sum of a re gularization term and a data error term) to an interpolation formulation (least square minimization of the data error term). An outlier rejection step is i ntroduced in this gradual registration process using a weighted least trimmed squares approach, aiming at improving the robustness of the algorithm. We use a patient-specific model discretized with the finite element method (FEM) in order to ensure a realistic mechanical behavior of the brain tissue. To meet the clinical time constraint, we parallelized the slowest step of the algorithm so that we can perform a full 3D image registration in 35 seconds ( including the image update time) on a heterogeneous cluster of 15 PCs. The algorithm has been tested on six cases of brain tumor resection, presenting a brain shift of up to 14 mm. The results show a good ability to recover la rge displacements, and a limited decrease of accuracy near the tumor resection cavity.
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IEEE Transactions on Medical Imaging, Institute of Electrical and Electronics Engineers, 2005, 24 (11), pp.1417-1427
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https://hal.inria.fr/inria-00615661
Contributeur : Project-Team Asclepios <>
Soumis le : vendredi 19 août 2011 - 18:06:31
Dernière modification le : vendredi 12 janvier 2018 - 11:03:36

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  • HAL Id : inria-00615661, version 1

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Olivier Clatz, Hervé Delingette, Ion-Florin Talos, Alexandra Golby, Ron Kikinis, et al.. Robust Non-Rigid Registration to Capture Brain Shift from Intra-Operative MRI. IEEE Transactions on Medical Imaging, Institute of Electrical and Electronics Engineers, 2005, 24 (11), pp.1417-1427. 〈inria-00615661〉

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